In complex task domains, such as games, students may exceed their teachers. Such tasks afford diverse means to tradeoff one type of performance for another, combining task elements in novel ways to yield method variations and strategy discoveries that, if mastered, might produce large or small leaps in performance. For the researcher interested in the development of extreme expertise in the wil...

This paper will describe the data warehouse/decision support/data mining system that we have developed to improve disk drive manufacturing yields in the IBM Storage Technology Division. The data warehouse combines operational data from our disk, wafer and head stack processing plants. Data is extracted weekly, cleansed and correlated with the test results for the disk drives assembled from the ...

Introduction Can automated solutions for logic diagnosis become a fundamental driver of yield improvement? or are they doomed to remain an “occasional entertaining diversion?” As we begin driving a transition in diagnosis from science projects to industrial solutions, we need to consider the differences between failure analysis (FA) and low yield analysis (LYA). We need to comprehend that this ...

Eamkajornsiri, Sutee, "Yield improvement of chemical mechanical planarization processes " (2005). Retrospective Theses and Dissertations. Paper 3043. The quality of this reproduction is dependent upon the quality of the copy submitted. Broken or indistinct print, colored or poor quality illustrations and photographs, print bleed-through, substandard margins, and improper alignment can adversely...

The objective of this paper is to present an infrastructure IP (I-IP) designed to characterize yield loss in the process back-end. The I-IP structure is described in using a bottom-up approach with emphasis on its scalability. Using this infrastructure IP, the defect density tracking as well as the test and diagnosis of process back-end critical parameters can be quickly and easily performed. T...

Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture...